Bayesian Testing |
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Bayesian Testing |
Bogey testing is inefficient. By extending the test duration beyond the required
life the total time on test can often be reduced. When the test duration is
extended it is necessary to make assumptions concerning the shape of the
distribution of the time to fail. This is done by assuming a Weibull
distribution for time to fail, and assuming a shape parameter. Recall from
Chapter 2 that the Weibull distribution can approximate many other distributions
by changing the value of the shape parameter.
Effect of the Shape Parameter
The figure below shows a population having a Weibull time to fail distribution with a shape parameter of 1. This figure shows a reliability of 95% at 1 bogey, and a mean of 19.5 bogeys; nearly 10 times greater than the Weibull distribution with a shape parameter of 3.6. The variance of the distribution increases as the shape parameter decreases. Variance is the equivalent of uncertainty, and the amount of testing is required to demonstrate reliability is dependent on the amount of variance in the population.
The figure below shows a population having a Weibull time to fail distribution with a shape parameter of 1.8. This figure shows a reliability of 95% at 1 bogey, and a mean of 5.2 bogeys.
The figure below shows a population having a Weibull time to fail distribution with a shape parameter of 8.0. This figure shows a reliability of 95% at 1 bogey, and a mean of 1.37 bogeys.
Estimating the Shape Parameter The best way to estimate the shape parameter is through prior testing. Many automotive companies require some testing to failure to allow the shape parameter to be determined. Keep detailed records of all tests and build a database of shape parameters. It is recommended to use the lower 90% confidence limit for the shape parameter because to the magnitude the shape parameter has on test requirements. In lack of any prior knowledge there are data sources available on the internet, or the shape parameter can be estimated based on the knowledge of the physics of failure. Be careful when estimating the shape parameter for electronics. Many sources state the shape parameter for electronics is 1.0 because there are is no mechanical wear in electronics. For electronic modules located in environmentally harsh conditions, such as under the hood of an automobile of in an airplane, fail as a result of mechanical ear. The extreme vibration, temperature cycling and in some cases contaminants cause mechanical failures. It is not uncommon to have shape parameters greater than 8.0 for electronic components. Determining Test Parameters where n is the number of units tested, both failed and surviving, and c2a,d is the critical value of the chi-square distribution with significance of a (0.05 for a confidence level of 95%) and d degrees of freedom. For failure truncated testing d is equal to 2r where r is the number of failed units. For time truncated testing d is equal to 2r+2. Example Solution =CHIINV(1-0.9,6) The lower 90% confidence limit for the mean of the transformed data is The lower 90% confidence limit for the reliability at 400 hours is Click Here to download this example in a spreadsheet. Example Solution =CHIINV(1-0.9,8) The lower 90% confidence limit for the mean of the transformed data is The lower 90% confidence limit for the reliability at 400 hours is Click Here to download this example in a spreadsheet. Reliability tests are often designed in a 2 step procedure; 1) how many test stands are available, and 2) what is the test duration given the number of test fixtures. For a sample of n units the required test duration to demonstrate a reliability of R at time t with a confidence level of 1-a assuming no failures is Example Solution Click Here to download this example in a spreadsheet. For a test duration of T the required sample size to demonstrate a reliability of R at time t with a confidence level of 1-a assuming no failures is Example Solution Click Here to download this example in a spreadsheet. |